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Elastic properties describe the reversible deformation (elastic response) of a material to an applied stress.They are a subset of the material properties that provide a quantitative description of the characteristics of a material, like its strength.
Poisson's ratio of a material defines the ratio of transverse strain (x direction) to the axial strain (y direction)In materials science and solid mechanics, Poisson's ratio (symbol: ν ()) is a measure of the Poisson effect, the deformation (expansion or contraction) of a material in directions perpendicular to the specific direction of loading.
The Poisson's ratio is a measure in which a material tends to expand in directions perpendicular to the direction of compression. After measuring the Young's modulus and the shear modulus, dedicated software determines the Poisson's ratio using Hooke's law which can only be applied to isotropic materials according to the different standards.
Gauge factor (GF) or strain factor of a strain gauge is the ratio of relative change in electrical resistance R, to the mechanical strain ε. The gauge factor is defined as: [ 1 ] G F = Δ R / R Δ L / L = Δ R / R ε = 1 + 2 ν + Δ ρ / ρ ε {\displaystyle GF={\frac {\Delta R/R}{\Delta L/L}}={\frac {\Delta R/R}{\varepsilon }}=1+2\nu +{\frac ...
room temperature. Calculated using Wikipedia reported values for density (21450 kg/m 3), Young's Modulus (167 GPa), and Poisson's ratio (0.38) CRC: 3260: 1730: 2800: CRC cites American Institute of Physics Handbook (AIPH) table 3f-2 for this value, but in AIPH table 2f-6 there are elastic constants reported that yield 3700,1570, 2620 WEL: 2680 ...
Poisson ratio: 0.064–0.28 [10] Mohs hardness ... Silicon is a chemical ... Other silicon compounds function as high-technology abrasives and new high-strength ...
In homogeneous and isotropic materials, these define Hooke's law in 3D, = + (), where σ is the stress tensor, ε the strain tensor, I the identity matrix and tr the trace function. Hooke's law may be written in terms of tensor components using index notation as σ i j = 2 μ ε i j + λ δ i j ε k k , {\displaystyle \sigma _{ij}=2\mu ...
Spectroscopic reflectance of a thin film on a substrate represents the ratio of the intensity of light reflected from the sample to the intensity of incident light, measured over a range of wavelengths, whereas spectroscopic transmittance, T(λ), represents the ratio of the intensity of light transmitted through the sample to the intensity of ...