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Simple prototypes for computer pun generation were reported in the early 1990s, [2] based on a natural language generator program, VINCI. Graeme Ritchie and Kim Binsted in their 1994 research paper described a computer program, JAPE, designed to generate question-answer-type puns from a general, i.e., non-humorous, lexicon. [ 3 ] (
Jape is a synonym for a practical joke. Jape or JAPE may also refer to: Jape (band), an Irish electronic/rock band; JAPE (linguistics), a transformation language widely used in natural language processing; JAPE, an automated pun generator; Jape (software), a Java-based proof assistant
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JAPE is a finite state transducer that operates over annotations based on regular expressions. Thus, it is useful for pattern-matching, semantic extraction, and many other operations over syntactic trees such as those produced by natural language parsers. JAPE is a version of CPSL – Common Pattern Specification Language.
Jape allows to make proof steps and undo them, and it shows the effect of the added proof steps which helps to understand strategies for finding proofs. [ 2 ] : 60 When the user adds and removes the proof steps, the proof tree is constructed which Jape can show either in a tree shape or in box forms. [ 5 ]
According to research results, the items show a good Rasch model fit, and rule-based generation can explain the item difficulty. [42] The first known item matrix generator was designed by Embretson, [43] [14] and her automatically generated items demonstrated good psychometric properties, as it is shown by Embretson and Reise. [44]
A toilet papered residence in Deerfield, Michigan. This is a list of practical joke topics (also known as a prank, gag, jape, or shenanigan) which are mischievous tricks or jokes played on someone, typically causing the victim to experience embarrassment, perplexity, confusion, or discomfort.
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.