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An AFM probe has a sharp tip on the free-swinging end of a cantilever that protrudes from a holder. [29] The dimensions of the cantilever are in the scale of micrometers. The radius of the tip is usually on the scale of a few nanometers to a few tens of nanometers.
In AFM, feedback loops control the operation of the microscope by keeping a fixed value a parameter of the tip's oscillation. [11] If the main feedback loop operates with the amplitude, the AFM mode is called amplitude modulation (AM). If it operates with the frequency shift, the AFM mode is called frequency modulation (FM).
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...
A common form of electric force microscopy involves a noncontact AFM mode of operation. In this mode the cantilever is oscillated at a resonant frequency of the cantilever and the AFM tip is held such that it only senses with long range electrostatic forces without entering the repulsive contact regime.
The instrumentation involved for pc-AFM is very similar to that necessary for traditional AFM or the modified conductive AFM. The main difference between pc-AFM and other types of AFM instruments is the illumination source that is focused through the inverted microscope objective and the neutral density filter that is positioned adjacent to the illumination source.
The conventional PFM operates in contact mode in which the AFM tip is in contact with the sample during the scanning. Contact mode is not suitable for samples with features susceptible to damage or displacement by the tip's drag. In Pin Point PFM, the AFM tip does not contact the surface.