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Virtual instrument software architecture (VISA) is a widely used application programming interface (API) in the test and measurement (T&M) industry for communicating with instruments from a computer. VISA is an industry standard implemented by several T&M companies, such as, Anritsu , Bustec , Keysight Technologies , Kikusui, National ...
Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.
Many wafers today are still tested one device at a time. If one wafer had 1000 of these devices and the time required to test one device was 10 seconds and the time for the prober to move from one device to another device was 1 second, then to test an entire wafer would take 1000 x 11 seconds = 11,000 seconds or roughly 3 hours.
The Java Device Test Suite is an extensible set of test packs, a shared management facility, and a distributed test execution harness that can be used to assess the quality of any device that implements a compatible combination of the Java ME technologies, including the following:
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
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