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  2. Bruker Releases AFM Zoom Option for 3D Optical Microscopes - AOL

    www.aol.com/2012/11/26/bruker-releases-afm-zoom...

    Bruker Releases AFM Zoom Option for 3D Optical Microscopes NanoLens™ Accessory Expands Power of ContourGT Systems BOSTON--(BUSINESS WIRE)-- Bruker announced today at the 2012 Materials Research ...

  3. NanoAndMore - Wikipedia

    en.wikipedia.org/wiki/NanoAndMore

    AFM probes sold by NanoAndMore fit all common Atomic Force Microscopes (AFM) like Asylum Research, Bruker, JPK, Molecular Imaging, Nanosurf, Veeco, WiTEK, NTMDT, Novascan, etc. As an important distributor of AFM probes it is often cited as a supplier in research papers and is therefore considered an important source of products for Atomic Force ...

  4. Atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_microscopy

    Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20 μm × 20 μm × 420 nm). The AFM can be operated in a number of modes, depending on the application.

  5. Gwyddion (software) - Wikipedia

    en.wikipedia.org/wiki/Gwyddion_(software)

    Gwyddion is a multiplatform modular free software for visualization and analysis of data from scanning probe microscopy (SPM) techniques (like AFM, MFM, STM, SNOM/NSOM). [1] The project is led by its main developers David Nečas (Yeti) and Petr Klapetek who work together with several various developers across the world.

  6. UK National Graphene Institute Selects Bruker's Dimension ...

    www.aol.com/2013/04/02/uk-national-graphene...

    UK National Graphene Institute Selects Bruker's Dimension FastScan AFM New Levels of Speed, Ease of Use, and Productivity Enable Next-Generation Applications SANTA BARBARA, Calif.--(BUSINESS WIRE ...

  7. Bruker Introduces New AFM Semiconductor ... - AOL

    www.aol.com/news/2013-04-04-bruker-introduces...

    Bruker Introduces New AFM Semiconductor Characterization Solution Highest Resolution Carrier Profiling Capability Confirmed by Imec SANTA BARBARA, Calif.--(BUSINESS WIRE)-- Bruker announced today ...

  8. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.

  9. NanoWorld - Wikipedia

    en.wikipedia.org/wiki/NanoWorld

    NanoWorld is the global market leader for tips for scanning probe microscopy (SPM) and atomic force microscopy (AFM). The atomic force microscope (AFM) is the defining instrument for the whole field of nanoscience and nanotechnology. It enables its users in research and high-tech industry to investigate materials at the atomic scale.

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