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The tester has all these features and can check solid-state devices in and out of circuit. Transistor h fe varies fairly widely with Ic, so measurements with the service type tester give readings that can differ quite a bit from the h fe in the transistor's real life application.
A rigorous test case based approach is often traditional for large software engineering projects that follow a Waterfall model. [2] However, at least one recent study did not show a dramatic difference in defect detection efficiency between exploratory testing and test case based testing. [3] Testing can be through black-, white-or grey-box ...
Handheld LCR meters typically have selectable test frequencies of 100 Hz, 120 Hz, 1 kHz, 10 kHz, and 100 kHz for top end meters. The display resolution and measurement range capability will typically change with the applied test frequency since the circuitry is more sensitive or less for a given component (i.e., an inductor or capacitor) as the ...
It has been used in testing the F-14, S-3, E-2, A-7 Corsair II, A-6, etc. VAST is considered by many to be the grandfather of modern avionics test equipment. In the years that followed the cold war, ATLAS found uses on many dual-use aircraft [ clarification needed ] for the U.S. and NATO , as well as commercial business, regional, and general ...
High-voltage and high-current test techniques TC 44 Safety of machinery - Electrotechnical aspects TC 45 Nuclear instrumentation SC 45A Instrumentation, control and electrical power systems of nuclear facilities SC 45B Radiation protection instrumentation TC 46
Clinical laboratory testing and in vitro diagnostic test systems: TC 213: Dimensional and geometrical product specifications and verification: TC 214: Elevating work platforms: TC 215: Health informatics: TC 216: Footwear: TC 217: Cosmetics: TC 218: Timber: TC 219: Floor coverings: TC 220: Cryogenic vessels: TC 221: Geosynthetics: TC 222 ...
A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.
For explosive devices, test requirements and methods are tailored from MIL-HDBK-1512 and NATO AOP-7. For batteries, guidance on test requirements is in RCC-Doc-319-99. Note: Surveillance Testing is a periodic repeat of the Acceptance Testing using trending or accelerated aging to authorize shelf life extensions.