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In some cases where the radius of the substitutional atom (ion) is substantially smaller than that of the atom (ion) it is replacing, its equilibrium position can be shifted away from the lattice site. These types of substitutional defects are often referred to as off-center ions. There are two different types of substitutional defects ...
The software development process is a typical application of Fagan inspection. As the costs to remedy a defect are up to 10 to 100 times less in the early operations compared to fixing a defect in the maintenance phase, [1] it is essential to find defects as close to the point of insertion as possible.
In crystallography, a vacancy is a type of point defect in a crystal where an atom is missing from one of the lattice sites. [2] Crystals inherently possess imperfections, sometimes referred to as crystallographic defects. Vacancies occur naturally in all crystalline materials.
Each inspector prepares for the meeting by reading the work product and noting each defect. In an inspection, a defect is any part of the work product that will keep an inspector from approving it. For example, if the team is inspecting a software requirements specification, each defect will be text in the document which an inspector disagrees ...
The defect concentration diagram (also problem concentration diagram [1]) is a graphical tool that is useful in analyzing the causes of the product or part defects. [2] It is a drawing of the product (or other item of interest), with all relevant views displayed, onto which the locations and frequencies of various defects are shown.
This could ease the theoretical phase diagram generation of multicomponent systems. For alloys containing transition metal elements there is a difficulty in interpretation of the Hume-Rothery electron concentration rule, as the values of e/a values (number of itinerant electrons per atom) for transition metals have been quite controversial for ...
IDEF0 Diagram Example. IDEF0, a compound acronym ("Icam DEFinition for Function Modeling", where ICAM is an acronym for "Integrated Computer Aided Manufacturing"), is a function modeling methodology for describing manufacturing functions, which offers a functional modeling language for the analysis, development, reengineering and integration of information systems, business processes or ...
A Software Defect Indicator is a pattern that can be found in source code that is strongly correlated with a software defect, ... Software engineering; References
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