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  2. Software defect indicator - Wikipedia

    en.wikipedia.org/wiki/Software_defect_indicator

    A Software Defect Indicator is a pattern that can be found in source code that is strongly correlated with a software defect, ... Software engineering; References

  3. Defect concentration diagram - Wikipedia

    en.wikipedia.org/wiki/Defect_concentration_diagram

    The defect concentration diagram (also problem concentration diagram [1]) is a graphical tool that is useful in analyzing the causes of the product or part defects. [2] It is a drawing of the product (or other item of interest), with all relevant views displayed, onto which the locations and frequencies of various defects are shown.

  4. V-model - Wikipedia

    en.wikipedia.org/wiki/V-Model

    The V-model is a graphical representation of a systems development lifecycle.It is used to produce rigorous development lifecycle models and project management models. The V-model falls into three broad categories, the German V-Modell, a general testing model, and the US government standard.

  5. Software inspection - Wikipedia

    en.wikipedia.org/wiki/Software_inspection

    Each inspector prepares for the meeting by reading the work product and noting each defect. In an inspection, a defect is any part of the work product that will keep an inspector from approving it. For example, if the team is inspecting a software requirements specification, each defect will be text in the document which an inspector disagrees ...

  6. IDEF0 - Wikipedia

    en.wikipedia.org/wiki/IDEF0

    IDEF0 Diagram Example. IDEF0, a compound acronym ("Icam DEFinition for Function Modeling", where ICAM is an acronym for "Integrated Computer Aided Manufacturing"), is a function modeling methodology for describing manufacturing functions, which offers a functional modeling language for the analysis, development, reengineering and integration of information systems, business processes or ...

  7. Orthogonal defect classification - Wikipedia

    en.wikipedia.org/wiki/Orthogonal_Defect...

    Orthogonal defect classification (ODC) [1] turns semantic information in the software defect stream into a measurement on the process. [2] The ideas were developed in the late 1980s and early 1990s by Ram Chillarege [3] at IBM Research. This has led to the development of new analytical methods used for software development and test process ...