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X-ray absorption spectroscopy (XAS) is a widely used technique for determining the local geometric and/or electronic structure of matter. [1] The experiment is usually performed at synchrotron radiation facilities, which provide intense and tunable X-ray beams. Samples can be in the gas phase, solutions, or solids. [2]
X-ray absorption edge spectroscopy corresponds to the transition from a core-level to an unoccupied orbital or band and mainly reflects the electronic unoccupied states. EXAFS, resulting from the interference in the single scattering process of the photoelectron scattered by surrounding atoms, provides information on the local structure.
Extended X-ray absorption fine structure (EXAFS), along with X-ray absorption near edge structure , is a subset of X-ray absorption spectroscopy . Like other absorption spectroscopies , XAS techniques follow Beer's law .
X-ray absorption near edge structure (XANES), also known as near edge X-ray absorption fine structure (NEXAFS), is a type of absorption spectroscopy that indicates the features in the X-ray absorption spectra of condensed matter due to the photoabsorption cross section for electronic transitions from an atomic core level to final states in the energy region of 50–100 eV above the selected ...
In electron microscopy an electron beam excites X-rays; there are two main techniques for analysis of spectra of characteristic X-ray radiation: energy-dispersive X-ray spectroscopy (EDS) and wavelength dispersive X-ray spectroscopy (WDS). In X-ray transmission (XRT), the equivalent atomic composition (Z eff) is captured based on photoelectric ...
X-ray absorption; X-ray enhancement; sample macroscopic effects; All elements absorb X-rays to some extent. Each element has a characteristic absorption spectrum which consists of a "saw-tooth" succession of fringes, each step-change of which has wavelength close to an emission line of the element.
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Surface-extended X-ray absorption fine structure (SEXAFS) is the surface-sensitive equivalent of the EXAFS technique. This technique involves the illumination of the sample by high-intensity X-ray beams from a synchrotron and monitoring their photoabsorption by detecting in the intensity of Auger electrons as a function of the incident photon energy.