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The Blech length must be considered when designing test structures to evaluate electromigration. This minimum length is typically some tens of microns for chip traces, and interconnections shorter than this are sometimes referred to as 'electromigration immortal'.
Black's Equation is a mathematical model for the mean time to failure (MTTF) of a semiconductor circuit due to electromigration: a phenomenon of molecular rearrangement (movement) in the solid phase caused by an electromagnetic field.
The language of mathematics has a wide vocabulary of specialist and technical terms. It also has a certain amount of jargon: commonly used phrases which are part of the culture of mathematics, rather than of the subject.
The length of a sinusoidal wave is commonly expressed as an angle, in units of degrees (with 360° in a wavelength) or radians (with 2π radians in a wavelength). So alternately the electrical length can be expressed as an angle which is the phase shift of the wave between the ends of the conductor [1] [3] [5]
Domain-specific terms must be recategorized into the corresponding mathematical domain. If the domain is unclear, but reasonably believed to exist, it is better to put the page into the root category:mathematics, where it will have a better chance of spotting and classification. See also: Glossary of mathematics
Feedback-controlled electromigration (FCE) is an experimental technique to investigate the phenomenon known as electromigration. By controlling the voltage applied as the conductance varies it is possible to keep the voltage at a critical level for electromigration .
This means by definition that the connection ∇ is flat there. In mentioned Aharonov–Bohm effect, however, the connection depends on the magnetic field through the tube since the holonomy along a non-contractible curve encircling the tube is the magnetic flux through the tube in the proper units. This can be detected quantum-mechanically ...
eFuses can be made out of silicon or metal traces. In both cases, they work (blow) by electromigration, the phenomenon where electric flow causes the conductor material to move. Although electromigration is generally undesired in chip design as it causes failures, eFuses are made of weak traces that are designed to fail before others do. [3] [4]