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  2. Crystallographic defect - Wikipedia

    en.wikipedia.org/wiki/Crystallographic_defect

    These types of substitutional defects are often referred to as off-center ions. There are two different types of substitutional defects: Isovalent substitution and aliovalent substitution. Isovalent substitution is where the ion that is substituting the original ion is of the same oxidation state as the ion it is replacing.

  3. Software defect indicator - Wikipedia

    en.wikipedia.org/wiki/Software_defect_indicator

    A Software Defect Indicator is a pattern that can be found in source code that is strongly correlated with a software defect, ... Software engineering; References

  4. Failure mode and effects analysis - Wikipedia

    en.wikipedia.org/wiki/Failure_mode_and_effects...

    graph with an example of steps in a failure mode and effects analysis. Failure mode and effects analysis (FMEA; often written with "failure modes" in plural) is the process of reviewing as many components, assemblies, and subsystems as possible to identify potential failure modes in a system and their causes and effects.

  5. Ishikawa diagram - Wikipedia

    en.wikipedia.org/wiki/Ishikawa_diagram

    Ishikawa diagrams (also called fishbone diagrams, [1] herringbone diagrams, cause-and-effect diagrams) are causal diagrams created by Kaoru Ishikawa that show the potential causes of a specific event. [2] Common uses of the Ishikawa diagram are product design and quality defect prevention to identify potential factors causing an overall effect ...

  6. Defect concentration diagram - Wikipedia

    en.wikipedia.org/wiki/Defect_concentration_diagram

    The defect concentration diagram (also problem concentration diagram [1]) is a graphical tool that is useful in analyzing the causes of the product or part defects. [2] It is a drawing of the product (or other item of interest), with all relevant views displayed, onto which the locations and frequencies of various defects are shown.

  7. Vacancy defect - Wikipedia

    en.wikipedia.org/wiki/Vacancy_defect

    In crystallography, a vacancy is a type of point defect in a crystal where an atom is missing from one of the lattice sites. [2] Crystals inherently possess imperfections, sometimes referred to as crystallographic defects. Vacancies occur naturally in all crystalline materials.

  8. Orthogonal defect classification - Wikipedia

    en.wikipedia.org/wiki/Orthogonal_Defect...

    Orthogonal defect classification (ODC) [1] turns semantic information in the software defect stream into a measurement on the process. [2] The ideas were developed in the late 1980s and early 1990s by Ram Chillarege [3] at IBM Research. This has led to the development of new analytical methods used for software development and test process ...

  9. IDEF0 - Wikipedia

    en.wikipedia.org/wiki/IDEF0

    IDEF0 Diagram Example. IDEF0, a compound acronym ("Icam DEFinition for Function Modeling", where ICAM is an acronym for "Integrated Computer Aided Manufacturing"), is a function modeling methodology for describing manufacturing functions, which offers a functional modeling language for the analysis, development, reengineering and integration of information systems, business processes or ...