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  2. Vegard's law - Wikipedia

    en.wikipedia.org/wiki/Vegard's_law

    Vegard's law assumes that both components A and B in their pure form (i.e., before mixing) have the same crystal structure. Here, a A (1-x) B x is the lattice parameter of the solid solution, a A and a B are the lattice parameters of the pure constituents, and x is the molar fraction of B in the solid solution.

  3. Crystallographic database - Wikipedia

    en.wikipedia.org/wiki/Crystallographic_database

    The algorithm searches for matches within a certain range of the lattice parameters. More accurate lattice parameters allow a narrower range and, thus, a better match. [31] Lattice matching is useful in identifying crystal phases in the early stages of single-crystal diffraction experiments and, thus, avoiding unnecessary full data collection ...

  4. Fractional coordinates - Wikipedia

    en.wikipedia.org/wiki/Fractional_coordinates

    A lattice in which the conventional basis is primitive is called a primitive lattice, while a lattice with a non-primitive conventional basis is called a centered lattice. The choice of an origin and a basis implies the choice of a unit cell which can further be used to describe a crystal pattern.

  5. Lattice constant - Wikipedia

    en.wikipedia.org/wiki/Lattice_constant

    Unit cell definition using parallelepiped with lengths a, b, c and angles between the sides given by α, β, γ [1]. A lattice constant or lattice parameter is one of the physical dimensions and angles that determine the geometry of the unit cells in a crystal lattice, and is proportional to the distance between atoms in the crystal.

  6. Scherrer equation - Wikipedia

    en.wikipedia.org/wiki/Scherrer_Equation

    The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis.

  7. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    The Rietveld method fits a calculated profile (including all structural and instrumental parameters) to experimental data. It employs the non-linear least squares method, and requires the reasonable initial approximation of many free parameters, including peak shape, unit cell dimensions and coordinates of all atoms in the crystal structure.

  8. Debye–Waller factor - Wikipedia

    en.wikipedia.org/wiki/Debye–Waller_factor

    Now we see the overall structure factor may be represented as a weighted sum of structure factors () corresponding to each atom. Set the displacement between the location in space for which we would like to know the scattering density and the reference position for the nucleus equal to a new variable t → = x → − x → k 0 {\displaystyle ...

  9. X-ray crystal truncation rod - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystal_truncation_rod

    X-ray crystal truncation rod scattering is a powerful method in surface science, based on analysis of surface X-ray diffraction (SXRD) patterns from a crystalline surface. For an infinite crystal, the diffracted pattern is concentrated in Dirac delta function like Bragg peaks.