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Negative-bias temperature instability (NBTI) is a key reliability issue in MOSFETs, a type of transistor aging.NBTI manifests as an increase in the threshold voltage and consequent decrease in drain current and transconductance of a MOSFET.
Liberty Analyzer - Analysis and validation of timing, power, noise and area data from characterization; TCAD. Victory Process - 2D/3D semiconductor process simulator; Victory Device - 2D/3D semiconductor device simulator; Virtual Wafer Fab - Emulation of wafer manufacturing to perform design-of-experiments and optimization.
Alfresco Software, Inc. and the Activiti developer community Modeler, Simulation, Execution. Data elements are not supported. Limited supported formats (read/saved internally in BPMN format without exporting capabilities). 2010-05-17 [1] 2019-07-03 [2] Apache License 2.0 [3] ActiveVOS: Informatica 2005 2014 Proprietary: ADONIS BPM Suite: BOC Group
In the 1970s and 1980s NMOS was favored owing to speed and area advantages, coupled with technology limitations and concerns related to isolation, parasitic effects and process complexity. During that era of NMOS-dominated LSI and the emergence of VLSI, the fundamental scaling laws of MOS technology were codified and broadly applied. [6]
Technology files and design rules are essential building blocks of the integrated circuit design process. Their accuracy and robustness over process technology, its variability and the operating conditions of the IC—environmental, parasitic interactions and testing, including adverse conditions such as electro-static discharge—are critical in determining performance, yield and reliability.
WASHINGTON (Reuters) -A U.S. appeals court on Monday threw out a $2.18 billion patent-infringement award won by patent owner VLSI Technology against Intel Corp, overturning one of the largest ...
Very-large-scale integration (VLSI) is the process of creating an integrated circuit (IC) by combining millions or billions of MOS transistors onto a single chip. VLSI began in the 1970s when MOS integrated circuit (metal oxide semiconductor) chips were developed and then widely adopted, enabling complex semiconductor and telecommunications technologies.
The VLSI Project was a DARPA-program initiated by Robert Kahn in 1978 [1] that provided research funding to a wide variety of university-based teams in an effort to improve the state of the art in microprocessor design, then known as Very Large Scale Integration (VLSI).