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Small-angle X-ray scattering (SAXS) is a small-angle scattering technique by which nanoscale density differences in a sample can be quantified. This means that it can determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes and characteristic distances of partially ordered materials. [1]
High-energy X-rays (HEX-rays) between 100 and 300 keV bear unique advantage over conventional hard X-rays, which lie in the range of 5–20 keV [2] They can be listed as follows: High penetration into materials due to a strongly reduced photo absorption cross section.
When Wilhelm Röntgen discovered X-rays in 1895 [1] physicists were uncertain of the nature of X-rays, but suspected that they were waves of electromagnetic radiation.The Maxwell theory of electromagnetic radiation was well accepted, and experiments by Charles Glover Barkla showed that X-rays exhibited phenomena associated with electromagnetic waves, including transverse polarization and ...
X-ray diffraction (XRD) is still the most used method for structural analysis of chemical compounds. Yet, with increasing detail on the relation of K β {\displaystyle K_{\beta }} -line spectra and the surrounding chemical environment of the ionized metal atom, measurements of the so-called valence-to-core (V2C) energy region become ...
Better resolution than traditional Si(Li) detectors at high count rates, Lower dead time (time spent on processing X-ray event), Faster analytical capabilities and more precise X-ray maps or particle data collected in seconds, Ability to be stored and operated at relatively high temperatures, eliminating the need for liquid nitrogen cooling.
Grazing incidence diffraction geometry. The angle of incidence, α, is close to the critical angle for the sample. The beam is diffracted in the plane of the surface of the sample by the angle 2θ, and often also out of the plane.
A powder X-ray diffractometer in motion. X-ray crystallography is the experimental science of determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract in specific directions.
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern.