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  2. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    DFT affects and depends on the methods used for test development, test application, and diagnostics. Most tool-supported DFT practiced in the industry today, at least for digital circuits, is predicated on a Structural test paradigm. Structural test makes no direct attempt to determine if the overall functionality of the circuit is correct.

  3. Test compression - Wikipedia

    en.wikipedia.org/wiki/Test_compression

    Test compression is a technique used to reduce the time and cost of testing integrated circuits.The first ICs were tested with test vectors created by hand. It proved very difficult to get good coverage of potential faults, so Design for testability (DFT) based on scan and automatic test pattern generation (ATPG) were developed to explicitly test each gate and path in a design.

  4. Level-sensitive scan design - Wikipedia

    en.wikipedia.org/wiki/Level-sensitive_scan_design

    Within the field of electronics Level-sensitive scan design (LSSD) is part of an integrated circuit manufacturing test process. It is a DFT scan design method which uses separate system and scan clocks to distinguish between normal and test mode. Latches are used in pairs, each has a normal data input, data output and clock for system operation.

  5. Fault coverage - Wikipedia

    en.wikipedia.org/wiki/Fault_coverage

    A fault coverage test passes when at least a specified percentage of all possible faults can be detected. If it does not pass, at least three options are possible. First, the designer can augment or otherwise improve the vector set, perhaps by using a more effective automatic test pattern generation tool. Second, the circuit may be re-defined ...

  6. Test engineer - Wikipedia

    en.wikipedia.org/wiki/Test_engineer

    Test engineers can have different expertise, which depends on what test process they are more familiar with (although many test engineers have full familiarity from the PCB level processes like ICT, JTAG, and AXI) to PCBA and system level processes like board functional test (BFT or FT), burn-in test, system level test ().

  7. Goertzel algorithm - Wikipedia

    en.wikipedia.org/wiki/Goertzel_algorithm

    The Goertzel algorithm is a technique in digital signal processing (DSP) for efficient evaluation of the individual terms of the discrete Fourier transform (DFT). It is useful in certain practical applications, such as recognition of dual-tone multi-frequency signaling (DTMF) tones produced by the push buttons of the keypad of a traditional analog telephone.

  8. Vienna Ab initio Simulation Package - Wikipedia

    en.wikipedia.org/wiki/Vienna_Ab_initio...

    The basic methodology is density functional theory (DFT), but the code also allows use of post-DFT corrections such as hybrid functionals mixing DFT and Hartree–Fock exchange (e.g. HSE, [3] PBE0 [4] or B3LYP [5]), many-body perturbation theory (the GW method [6]) and dynamical electronic correlations within the random phase approximation (RPA ...

  9. DFT matrix - Wikipedia

    en.wikipedia.org/wiki/DFT_matrix

    The DFT is (or can be, through appropriate selection of scaling) a unitary transform, i.e., one that preserves energy. The appropriate choice of scaling to achieve unitarity is 1 / N {\displaystyle 1/{\sqrt {N}}} , so that the energy in the physical domain will be the same as the energy in the Fourier domain, i.e., to satisfy Parseval's theorem .