Search results
Results From The WOW.Com Content Network
A power-on self-test (POST) is a process performed by firmware or software routines immediately after a computer or other digital electronic device is powered on. [ 1 ] POST processes may set the initial state of the device from firmware and detect if any hardware components are non-functional.
A typical card for desktop computers has a different bus interface on each edge; a card for laptop computers may have both a miniPCI and a parallel port connector (plus USB to supply power). Modern motherboards often do not broadcast POST codes to their PCI Express slots (PCIe switches only pass on transactions after having been configured to ...
A drive that implements S.M.A.R.T. may optionally implement a number of self-test or maintenance routines, and the results of the tests are kept in the self-test log. The self-test routines may be used to detect any unreadable sectors on the disk, so that they may be restored from back-up sources (for example, from other disks in a RAID). This ...
The AOL.com video experience serves up the best video content from AOL and around the web, curating informative and entertaining snackable videos.
FPGAs, and PLAs allow POST (and BIOS) to exist as hardware. Before either one existed state machines existed in hardware. Most implemented a power-on self test -- imagine trying to debug one of these things without knowing if the machine was able to provide reliable debug information. Kernel.package 23:37, 30 September 2010 (UTC)
Programmable built-in self-test (pBIST) Memory built-in self-test (mBIST) - e.g. with the Marinescu algorithm [2] Logic built-in self-test (LBIST) Analog and mixed-signal built-in self-test (AMBIST) Continuous built-in self-test (CBIST, C-BIT) Event-driven built-in self-test, such as the BIST done to an aircraft's systems after the aircraft lands.
For example, Open Firmware is essential for reliably identifying slave I 2 C devices like temperature sensors for hardware monitoring, [4]: §5.1 whereas the alternative solution of performing a blind probe of the I 2 C bus, as has to be done by software like lm_sensors on generic hardware, is known to result in serious hardware issues under ...
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.