When.com Web Search

  1. Ads

    related to: most powerful microscope magnification equation

Search results

  1. Results From The WOW.Com Content Network
  2. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  3. Electron microscope - Wikipedia

    en.wikipedia.org/wiki/Electron_microscope

    Reproduction of an early electron microscope constructed by Ernst Ruska in the 1930s. Many developments laid the groundwork of the electron optics used in microscopes. [2] One significant step was the work of Hertz in 1883 [3] who made a cathode-ray tube with electrostatic and magnetic deflection, demonstrating manipulation of the direction of an electron beam.

  4. Objective (optics) - Wikipedia

    en.wikipedia.org/wiki/Objective_(optics)

    One of the most important properties of microscope objectives is their magnification.The magnification typically ranges from 4× to 100×. It is combined with the magnification of the eyepiece to determine the overall magnification of the microscope; a 4× objective with a 10× eyepiece produces an image that is 40 times the size of the object.

  5. Microscopy - Wikipedia

    en.wikipedia.org/wiki/Microscopy

    Antonie van Leeuwenhoek (1632–1723). The field of microscopy (optical microscopy) dates back to at least the 17th-century.Earlier microscopes, single lens magnifying glasses with limited magnification, date at least as far back as the wide spread use of lenses in eyeglasses in the 13th century [2] but more advanced compound microscopes first appeared in Europe around 1620 [3] [4] The ...

  6. Atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_microscopy

    Atomic force microscopy [1] (AFM) is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe.

  7. Scanning tunneling microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_tunneling_microscope

    A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. [1][2][3] STM senses the surface by using an extremely sharp conducting tip that can ...

  1. Ad

    related to: most powerful microscope magnification equation