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Atomic force microscopy [1] (AFM) is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe.
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
AFM-IR has also been used to evaluate and map mineral content, crystallinity, collagen maturity and acid phosphate content via ratiometric analysis of various absorption bands in bone. [66] AFM-IR has also been used to perform spectroscopy and chemical mapping of structural lipids in human skin, [75] cells [60] and hair [76]
By using the elastic changes under the AFM tip, an image of much greater detail than the AFM topography can be generated. Ultrasonic force microscopy allows the local mapping of elasticity in atomic force microscopy by the application of ultrasonic vibration to the cantilever or sample. To analyze the results of ultrasonic force microscopy in a ...
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.
Simulated HREM images for GaN[0001] The contrast of a high resolution transmission electron microscopy image arises from the interference in the image plane of the electron wave with itself. Due to our inability to record the phase of an electron wave, only the amplitude in the image plane is recorded.
The conventional PFM operates in contact mode in which the AFM tip is in contact with the sample during the scanning. Contact mode is not suitable for samples with features susceptible to damage or displacement by the tip's drag. In Pin Point PFM, the AFM tip does not contact the surface.
In AFM, feedback loops control the operation of the microscope by keeping a fixed value a parameter of the tip's oscillation. [11] If the main feedback loop operates with the amplitude, the AFM mode is called amplitude modulation (AM). If it operates with the frequency shift, the AFM mode is called frequency modulation (FM).