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Graph and image of single-slit diffraction. As an example, an exact equation can now be derived for the intensity of the diffraction pattern as a function of angle in the case of single-slit diffraction. A mathematical representation of Huygens' principle can be used to start an equation.
Same double-slit assembly (0.7 mm between slits); in top image, one slit is closed. In the single-slit image, a diffraction pattern (the faint spots on either side of the main band) forms due to the nonzero width of the slit. This diffraction pattern is also seen in the double-slit image, but with many smaller interference fringes.
Graph of 2 dimensional plot. In addition to the east (E) and west (W) neighbors, a general grid node P, now also has north (N) and south (S) neighbors. The same notation is used here for all faces and cell dimensions as in one dimensional analysis. When the above equation is formally integrated over the Control volume, we obtain
The effects of diffraction are often seen in everyday life. The most striking examples of diffraction are those that involve light; for example, the closely spaced tracks on a CD or DVD act as a diffraction grating to form the familiar rainbow pattern seen when looking at a disc.
Diffraction geometry, showing aperture (or diffracting object) plane and image plane, with coordinate system. If the aperture is in x ′ y ′ plane, with the origin in the aperture and is illuminated by a monochromatic wave, of wavelength λ, wavenumber k with complex amplitude A(x ′,y ′), and the diffracted wave is observed in the unprimed x,y-plane along the positive -axis, where l,m ...
In electron diffraction, a diffraction pattern is produced by the interaction of the electron beam and the crystal potential. The real space and reciprocal space information about a crystal structure can be related through the Fourier transform relationships shown below, where () is in real space and corresponds to the crystal potential, and () is its Fourier transform in reciprocal space.
In optics, the Fraunhofer diffraction equation is used to model the diffraction of waves when plane waves are incident on a diffracting object, and the diffraction pattern is viewed at a sufficiently long distance (a distance satisfying Fraunhofer condition) from the object (in the far-field region), and also when it is viewed at the focal plane of an imaging lens.
This equation, Bragg's law, describes the condition on θ for constructive interference. [12] A map of the intensities of the scattered waves as a function of their angle is called a diffraction pattern. Strong intensities known as Bragg peaks are obtained in the diffraction pattern when the scattering angles satisfy Bragg condition.