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Max Knoll (17 July 1897 – 6 November 1969) [1] was a German electrical engineer and co-inventor of the electron microscope.Knoll was born in Wiesbaden and studied at the University of Munich and at the Technischen Hochschulen in Munich and Berlin-Charlottenburg, where he obtained his doctorate in the Institute for High Voltage Technology.
Ernst August Friedrich Ruska (German pronunciation: [ɛʁnst ˈʁʊskaː] ⓘ; 25 December 1906 – 27 May 1988) [1] was a German physicist who won the Nobel Prize in Physics in 1986 for his work in electron optics, including the design of the first electron microscope.
The team consisted of several PhD students including Ernst Ruska. In 1931, Max Knoll and Ernst Ruska [12] [13] successfully generated magnified images of mesh grids placed over an anode aperture. The device, a replicate of which is shown in the figure, used two magnetic lenses to achieve higher magnifications, the first electron microscope.
The first TEM was demonstrated by Max Knoll and Ernst Ruska in 1931, with this group developing the first TEM with resolution greater than that of light in 1933 and the first commercial TEM in 1939. In 1986, Ruska was awarded the Nobel Prize in physics for the development of transmission electron microscopy. [2]
1931: Max Knoll and Ernst Ruska start to build the first electron microscope. It is a transmission electron microscope (TEM). 1936: Erwin Wilhelm Müller invents the field emission microscope. 1938: James Hillier builds another TEM. 1951: Erwin Wilhelm Müller invents the field ion microscope and is the first to see atoms.
In 1931, Ernst Ruska (1986 Nobel Prize award winner) and Max Knoll created the first electron microscope. This invention led to the scanning electron microscope and transmission electron microscope, which later contributed to immunoelectron microscopy.
Ernst Ruska and Max Knoll build the first prototype electron microscope. Paul Dirac proposes that the existence of a single magnetic monopole in the universe would suffice to explain the quantization of electrical charge. [7]
Electron channelling contrast imaging (ECCI) is a scanning electron microscope (SEM) diffraction technique used in the study of defects in materials. These can be dislocations or stacking faults that are close to the surface of the sample, low angle grain boundaries or atomic steps.