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Xennials is a portmanteau blending the words Generation X and Millennials to describe a "micro-generation" [5] [6] or "cross-over generation" [7] of people whose birth years are between the mid-late 1970s and the early-mid 1980s.
SQL Server 2008 and 2012 SSRS can also prepare reports in Microsoft Word (DOC) format, while third-party report generators offer additional output formats. Users can interact with the Report Server web service directly, or instead use Report Manager, a Web-based application that interfaces with the Report Server web service.
Report generation functionality is almost always present in database systems, [citation needed] where the source of the data is the database itself. It can also be argued that report generation is part of the purpose of a spreadsheet. Standalone report generators may work with multiple data sources and export reports to different document formats.
Members of Generation Z, the second-to-youngest living generation, were born between 1997 and 2012. According to the Pew Research Center , Gen Z'ers are facing a unique set of circumstances as ...
Automatic item generation (AIG), or automated item generation, is a process linking psychometrics with computer programming. It uses a computer algorithm to automatically create test items that are the basic building blocks of a psychological test. The method was first described by John R. Bormuth [1] in the 1960s but was not developed until ...
Idaho National Laboratory ran the Aurora Generator Test in 2007 to demonstrate how a cyberattack could destroy physical components of the electric grid. [1] The experiment used a computer program to rapidly open and close a diesel generator 's circuit breakers out of phase from the rest of the grid, thereby subjecting the engine to abnormal ...
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
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