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A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer , then at IBM Zürich , the Nobel Prize in Physics in 1986.
Nanosurf AG, headquartered in Liestal, Switzerland, is a developer, manufacturer and supplier of metrology solutions for industrial and academic research, [1] and educational purposes. [2] Nanosurf's atomic force microscopes ( AFM ) and scanning tunneling microscopes ( STM ) are used for metrological surface inspections and for the ...
ERC-1 (solid state physics and chemistry) focuses on electroceramics and nanoelectronic oxides, materials for Green IT, electromagnetic field mapping, electron optics and method development, metallic alloys and crystal growth, catalysis, nanofabrication and quantum sensing, scanning tunneling microscopy and spectroscopy and momentum-resolved ...
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.
The spin polarized scanning tunneling microscope is a versatile instrument which has gained tremendous attention due to its enhanced surface sensitivity and lateral resolution up to atomic scale, and can be used as an important tool to study ferromagnetic materials, such as dysprosium (Dy), quasi-2D thin films, nano islands and quasi-1D ...
Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. Developed in 1996 by Oral, Bending and Henini, [2] SHPM allows mapping the magnetic induction associated with a sample.