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  2. Stuck-at fault - Wikipedia

    en.wikipedia.org/wiki/Stuck-at_fault

    A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical '1', '0' and 'X'. For example, an input is tied to a logical 1 state during test generation to ...

  3. Fault model - Wikipedia

    en.wikipedia.org/wiki/Fault_model

    Basic fault models in digital circuits include: Static faults, which give incorrect values at any speed and sensitized by performing only one operation: the stuck-at fault model. A signal, or gate output, is stuck at a 0 or 1 value, independent of the inputs to the circuit. the bridging fault model. Two signals are connected together when they ...

  4. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

  5. No fault found - Wikipedia

    en.wikipedia.org/wiki/No_fault_found

    No fault found (NFF), no trouble found (NTF) or no defect found (NDF) are terms used in the field of maintenance, where a unit is removed from service following a complaint of a perceived fault by operators or an alarm from its BIT (built-in test) equipment. The unit is then checked, but no anomaly is detected by the maintainer.

  6. Chevron (CVX) to Halt Gorgon Project Train 3 for Fault Testing

    www.aol.com/news/chevron-cvx-halt-gorgon-project...

    Chevron (CVX) aims to temporarily pause the Gorgon Train Three plant during the second quarter of 2021.

  7. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    While the task of testing a single logic gate at a time sounds simple, there is an obstacle to overcome. For today's highly complex designs, most gates are deeply embedded whereas the test equipment is only connected to the primary Input/outputs (I/Os) and/or some physical test points. The embedded gates, hence, must be manipulated through ...

  8. Fault coverage - Wikipedia

    en.wikipedia.org/wiki/Fault_coverage

    In digital electronics, fault coverage refers to stuck-at fault coverage. [1] It is measured by sticking each pin of the hardware model at logic '0' and logic '1', respectively, and running the test vectors. If at least one of the outputs differs from what is to be expected, the fault is said to be detected.

  9. Health Concerns Arise After Photos Of Two Boeing Astronauts ...

    www.aol.com/imagine-claustrophobia-photos...

    Recently released photos of two NASA astronauts stranded aboard the International Space Station (ISS) have caused health concerns to rise. Although Sunita Williams and Barry Wilmore were ...