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An atomic force microscope on the left with controlling computer on the right. Atomic force microscopy [1] (AFM) gathers information by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning.
Atomic force microscope inside a FTIR spectrometer with the optical interface. The earliest measurements combining AFM with infrared spectroscopy were performed in 1999 by Hammiche et al. at the University of Lancaster in the United Kingdom, [1] in an EPSRC-funded project led by M Reading and H M Pollock.
1967: Erwin Wilhelm Müller adds time-of-flight spectroscopy to the field ion microscope, making the first atom probe and allowing the chemical identification of each individual atom. 1981: Gerd Binnig and Heinrich Rohrer develop the scanning tunneling microscope (STM). 1986: Gerd Binnig, Quate, and Gerber invent the atomic force microscope (AFM).
In 1985, Binnig invented the atomic force microscope (AFM) [6] and Binnig, Christoph Gerber and Calvin Quate went on to develop a working version of this new microscope for insulating surfaces. [7] In 1987 Binnig was appointed IBM Fellow. In the same year, he started the IBM Physics group Munich, working on creativity [8] and atomic force ...
Electrostatic force microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. ("Dynamic" here means that the cantilever is oscillating and does not make contact with the sample). This force arises due to the attraction or repulsion of separated charges.
Ultrasonic force microscopy allows the local mapping of elasticity in atomic force microscopy by the application of ultrasonic vibration to the cantilever or sample. To analyze the results of ultrasonic force microscopy in a quantitative fashion, a force-distance curve measurement is done with ultrasonic vibration applied to the cantilever base ...
Techniques that can be used to perform force spectroscopy include atomic force microscopy, [2] optical tweezers, [4] magnetic tweezers, acoustic force spectroscopy, [5] microneedles, [6] and biomembranes. [7] Force spectroscopy measures the behavior of a molecule under stretching or torsional mechanical force.
STM can study only conductive materials, but in 1985 with the invention of the Atomic Force Microscope (AFM) by Binning and his colleagues, also non conductive surfaces can be observed. [9] Afterwards, AFMs were modified to obtain data on normal and frictional forces: these modified microscopes are called Friction Force Microscopes (FFM) or ...