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2. Atomic force microscopy - Wikipedia

   en.wikipedia.org/wiki/Atomic_force_microscopy

   Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

3. Bruker Releases AFM Zoom Option for 3D Optical Microscopes - AOL

   www.aol.com/2012/11/26/bruker-releases-afm-zoom...

   Bruker Releases AFM Zoom Option for 3D Optical Microscopes NanoLens™ Accessory Expands Power of ContourGT Systems BOSTON--(BUSINESS WIRE)-- Bruker announced today at the 2012 Materials Research ...

4. Conductive atomic force microscopy - Wikipedia

   en.wikipedia.org/wiki/Conductive_atomic_force...

   Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...

5. Kelvin probe force microscope - Wikipedia

   en.wikipedia.org/wiki/Kelvin_probe_force_microscope

   Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.

6. Bruker Introduces New AFM Semiconductor ... - AOL

   www.aol.com/2013/04/04/bruker-introduces-new-afm...

   Bruker Introduces New AFM Semiconductor Characterization Solution Highest Resolution Carrier Profiling Capability Confirmed by Imec SANTA BARBARA, Calif.--(BUSINESS WIRE)-- Bruker announced today ...

7. UK National Graphene Institute Selects Bruker's Dimension ...

   www.aol.com/news/2013-04-02-uk-national-graphene...

   UK National Graphene Institute Selects Bruker's Dimension FastScan AFM New Levels of Speed, Ease of Use, and Productivity Enable Next-Generation Applications SANTA BARBARA, Calif.--(BUSINESS WIRE ...