When.com Web Search

  1. Ads

    related to: fs70 semiconductor inspection microscope price

Search results

  1. Results From The WOW.Com Content Network
  2. Scanning capacitance microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_capacitance...

    The name Scanning Capacitance Microscopy was first used to describe a quality control tool for the RCA/CED (Capacitance Electronic Disc), [1] a video disk technology that was a predecessor of the DVD. It has since been adapted for use in combination with scanned probe microscopes for measuring other systems and materials with semiconductor ...

  3. Differential interference contrast microscopy - Wikipedia

    en.wikipedia.org/wiki/Differential_interference...

    Laser-induced optical damage in LiNbO 3 under 150× Nomarski microscopy. Differential interference contrast (DIC) microscopy, also known as Nomarski interference contrast (NIC) or Nomarski microscopy, is an optical microscopy technique used to enhance the contrast in unstained, transparent samples. DIC works on the principle of interferometry ...

  4. Semiconductor device fabrication - Wikipedia

    en.wikipedia.org/wiki/Semiconductor_device...

    Semiconductor manufacturing equipment has been considered costly since 1978. [46] In 1984, KLA developed the first automatic reticle and photomask inspection tool. [47] In 1985, KLA developed an automatic inspection tool for silicon wafers, which replaced manual microscope inspection. [48]

  5. Focused ion beam - Wikipedia

    en.wikipedia.org/wiki/Focused_ion_beam

    Focused ion beam. Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM).

  6. Confocal microscopy - Wikipedia

    en.wikipedia.org/wiki/Confocal_microscopy

    Fluorescence and confocal microscopes operating principle. Confocal microscopy, most frequently confocal laser scanning microscopy (CLSM) or laser scanning confocal microscopy (LSCM), is an optical imaging technique for increasing optical resolution and contrast of a micrograph by means of using a spatial pinhole to block out-of-focus light in image formation. [1]

  7. Scanning acoustic microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_acoustic_microscope

    A scanning acoustic microscope (SAM) is a device which uses focused sound to investigate, measure, or image an object (a process called scanning acoustic tomography). It is commonly used in failure analysis and non-destructive evaluation. It also has applications in biological and medical research. The semiconductor industry has found the SAM ...

  1. Ads

    related to: fs70 semiconductor inspection microscope price