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  2. Atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_microscopy

    Atomic force microscopy [1] (AFM) is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe.

  3. Non-contact atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Non-contact_atomic_force...

    Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...

  4. Infrared Nanospectroscopy (AFM-IR) - Wikipedia

    en.wikipedia.org/wiki/Infrared_Nanospectroscopy...

    AFM-IR has also been used to evaluate and map mineral content, crystallinity, collagen maturity and acid phosphate content via ratiometric analysis of various absorption bands in bone. [66] AFM-IR has also been used to perform spectroscopy and chemical mapping of structural lipids in human skin, [75] cells [60] and hair [76]

  5. Microscopy - Wikipedia

    en.wikipedia.org/wiki/Microscopy

    By using the elastic changes under the AFM tip, an image of much greater detail than the AFM topography can be generated. Ultrasonic force microscopy allows the local mapping of elasticity in atomic force microscopy by the application of ultrasonic vibration to the cantilever or sample. To analyze the results of ultrasonic force microscopy in a ...

  6. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.

  7. Piezoresponse force microscopy - Wikipedia

    en.wikipedia.org/wiki/Piezoresponse_force_microscopy

    From left to right shows images of increasing magnification where the scale bar in the first image is 50 μm and in the third is 200 nm. The first image shows the substrate, cantilever and the tip whereas the second image shows the tip geometry whilst the last image shows the tip apex and demonstrates the fine point that is achieved e.g. radius ...

  8. Molecular self-assembly - Wikipedia

    en.wikipedia.org/wiki/Molecular_self-assembly

    Molecular self-assembly is a key concept in supramolecular chemistry. [6] [7] [8] This is because assembly of molecules in such systems is directed through non-covalent interactions (e.g., hydrogen bonding, metal coordination, hydrophobic forces, van der Waals forces, pi-stacking interactions, and/or electrostatic) as well as electromagnetic interactions.

  9. Bimodal atomic force microscopy - Wikipedia

    en.wikipedia.org/.../Bimodal_atomic_force_microscopy

    In AFM, feedback loops control the operation of the microscope by keeping a fixed value a parameter of the tip's oscillation. [11] If the main feedback loop operates with the amplitude, the AFM mode is called amplitude modulation (AM). If it operates with the frequency shift, the AFM mode is called frequency modulation (FM).