Search results
Results From The WOW.Com Content Network
The Blech length must be considered when designing test structures to evaluate electromigration. This minimum length is typically some tens of microns for chip traces, and interconnections shorter than this are sometimes referred to as 'electromigration immortal'.
Black's Equation is a mathematical model for the mean time to failure (MTTF) of a semiconductor circuit due to electromigration: a phenomenon of molecular rearrangement (movement) in the solid phase caused by an electromagnetic field.
Diffusion and electromigration tend to be accelerated by high temperatures, shortening the lifetime of the device; damage to junctions not leading to immediate failure may manifest as altered current–voltage characteristics of the junctions. Electrical overstress failures can be classified as thermally-induced, electromigration-related and ...
The main causes of transistor aging in MOSFETs are electromigration and charge trapping. Electromigration is the movement of ions caused by momentum from the transfer of electrons in the conductor. This results in degradation of the material, causing intermittent glitches that are very difficult to diagnose, and eventual failure.
eFuses can be made out of silicon or metal traces. In both cases, they work (blow) by electromigration, the phenomenon where electric flow causes the conductor material to move. Although electromigration is generally undesired in chip design as it causes failures, eFuses are made of weak traces that are designed to fail before others do. [3] [4]
The Nernst–Planck equation is a continuity equation for the time-dependent concentration (,) of a chemical species: + = where is the flux.It is assumed that the total flux is composed of three elements: diffusion, advection, and electromigration.
Electrochemical migration (ECM) is the dissolution and movement of metal ions in presence of electric potential, which results in the growth of dendritic structures between anode and cathode.
Dendrite growth requires moisture capable of dissolving the metal into a solution of metal ions, which are then redistributed by electromigration in the presence of an electromagnetic field. While the precise mechanism for whisker formation remains unknown, it is known that whisker formation does not require either dissolution of the metal or ...