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In some cases where the radius of the substitutional atom (ion) is substantially smaller than that of the atom (ion) it is replacing, its equilibrium position can be shifted away from the lattice site. These types of substitutional defects are often referred to as off-center ions. There are two different types of substitutional defects ...
For example, the defect may result in an ion on its own ion site or a vacancy on the cation site. To complete the reactions, the proper number of each ion must be present (mass balance), an equal number of sites must exist (site balance), and the sums of the charges of the reactants and products must also be equal (charge balance).
This could ease the theoretical phase diagram generation of multicomponent systems. For alloys containing transition metal elements there is a difficulty in interpretation of the Hume-Rothery electron concentration rule, as the values of e/a values (number of itinerant electrons per atom) for transition metals have been quite controversial for ...
In crystallography, a vacancy is a type of point defect in a crystal where an atom is missing from one of the lattice sites. [2] Crystals inherently possess imperfections, sometimes referred to as crystallographic defects. Vacancies occur naturally in all crystalline materials.
Such defects may be the result of lattice irregularities or extrinsic substitutional or interstitial impurities, introduced during or after the diamond growth. The defects affect the material properties of diamond and determine to which type a diamond is assigned; the most dramatic effects are on the diamond color and electrical conductivity ...
In materials science, an interstitial defect is a type of point crystallographic defect where an atom of the same or of a different type, occupies an interstitial site in the crystal structure. When the atom is of the same type as those already present they are known as a self-interstitial defect .
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The defect concentration diagram (also problem concentration diagram [1]) is a graphical tool that is useful in analyzing the causes of the product or part defects. [2] It is a drawing of the product (or other item of interest), with all relevant views displayed, onto which the locations and frequencies of various defects are shown.