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  2. Non-contact atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Non-contact_atomic_force...

    Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...

  3. Atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_microscopy

    Dynamic contact mode (also called intermittent contact, AC mode or tapping mode) was developed to bypass this problem. [12] Nowadays, tapping mode is the most frequently used AFM mode when operating in ambient conditions or in liquids. In tapping mode, the cantilever is driven to oscillate up and down at or near its resonance frequency. This ...

  4. Scanning probe microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_probe_microscopy

    This interaction depends on the type of SPM, for scanning tunneling microscopy the interaction is the tunnel current, for contact mode AFM or MFM it is the cantilever deflection, etc. The type of feedback loop used is usually a PI-loop, which is a PID-loop where the differential gain has been set to zero (as it amplifies noise).

  5. Vehicle Dynamics Integrated Management - Wikipedia

    en.wikipedia.org/wiki/Vehicle_Dynamics...

    Vehicle Dynamics Integrated Management (VDIM) is an integrated vehicle handling and software control system developed by Toyota. It involves an omnibus computer linkage of traction control, electronic stability control, electronic steering, and other systems, with the intent of improving responsiveness to driver input, performance, and overall ...

  6. Near-field scanning optical microscope - Wikipedia

    en.wikipedia.org/wiki/Near-field_scanning...

    Constant force feedback mode is similar to the feedback mechanism used in atomic force microscopy (AFM). Experiments can be performed in contact, intermittent contact, and non-contact modes. In shear force feedback mode, a tuning fork is mounted alongside the tip and made to oscillate at its resonance frequency.

  7. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    SKP has been used to investigate the surface potential of materials used in solar cells, with the advantage that it is a non-contact, and therefore a non-destructive technique. [28] It can be used to determine the electron affinity of different materials in turn allowing the energy level overlap of conduction bands of differing materials to be ...

  8. Bimodal atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Bimodal_atomic_force...

    Bimodal AFM might be operated with several feedback loops. This gives rise to a variety of bimodal configurations. [12] The configurations are termed AM-open loop, AM-FM, FM-FM. [13] For example, bimodal AM-FM means that the first mode is operated with an amplitude modulation loop while the 2nd mode is operated with a frequency modulation loop.

  9. Magnetic force microscope - Wikipedia

    en.wikipedia.org/wiki/Magnetic_force_microscope

    MFM images of 3.2 Gb and 30 Gb computer hard-drive surfaces. Comparison of Faraday-effect image (left) and MFM image (inset, lower-right) of a magnetic film. Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the ...