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JTAG (named after the Joint Test Action Group which codified it) is an industry standard for verifying designs of and testing printed circuit boards after manufacture.. JTAG implements standards for on-chip instrumentation in electronic design automation (EDA) as a complementary tool to digital simulation. [1]
At minimum, a testbench contains an instantiation of the model (called the device under test or DUT), pin/signal declarations for the model's I/O, and a clock waveform. The testbench code is event driven: the engineer writes HDL statements to implement the (testbench-generated) reset-signal, to model interface transactions (such as a host–bus ...
The logic values observed at the device's primary outputs, while applying a test pattern to some device under test (DUT), are called the output of that test pattern. The output of a test pattern, when testing a fault-free device that works exactly as designed, is called the expected output of that test pattern.
VHDL-1987,-1993,-2002,-2008, V2001, SV2005, SV2009, SV2012, SV2017: The original Modeltech (VHDL) simulator was the first mixed-language simulator capable of simulating VHDL and Verilog design entities together. In 2003, ModelSim 5.8 was the first simulator to begin supporting features of the Accellera SystemVerilog 3.0 standard. [1]
In December 2009, a technical subcommittee of Accellera — a standards organization in the electronic design automation (EDA) industry — voted to establish the UVM and decided to base this new standard on the Open Verification Methodology (OVM-2.1.1), [1] a verification methodology developed jointly in 2007 by Cadence Design Systems and Mentor Graphics.
VHDL source for a signed adder. VHDL (VHSIC Hardware Description Language) is a hardware description language that can model the behavior and structure of digital systems at multiple levels of abstraction, ranging from the system level down to that of logic gates, for design entry, documentation, and verification purposes.
Quartus Prime enables analysis and synthesis of HDL designs, which enables the developer to compile their designs, perform timing analysis, examine RTL diagrams, simulate a design's reaction to different stimuli, and configure the target device with the programmer.
In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test equipment. The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device.