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Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...
Here are some methods that can aid fault injection to efficiently explore the fault space to reach higher fault coverage in less simulation time. Sensitivity analysis: [ 9 ] In this method, sensitivity analysis has been used to identify the most important signals that have a higher impact on the system's specification.
Burst errors include those due to disc material (defects of aluminum reflecting film, poor reflective index of transparent disc material), disc production (faults during disc forming and disc cutting etc.), disc handling (scratches – generally thin, radial and orthogonal to direction of recording) and variations in play-back mechanism.
In this example, we shall encode 14 bits of message with a 3-bit CRC, with a polynomial x 3 + x + 1. The polynomial is written in binary as the coefficients; a 3rd-degree polynomial has 4 coefficients ( 1 x 3 + 0 x 2 + 1 x + 1 ).
Sometimes a timeshift (delay) is set between systems, which increases the detection probability of errors induced by external influences (e.g. voltage spikes, ionizing radiation, or in situ reverse engineering).
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
The impact of any latent fault tests, and The operational profile (environmental stress factors). Given a component database calibrated with field failure data that is reasonably accurate, [ 1 ] the method can predict device level failure rate per failure mode, useful life, automatic diagnostic effectiveness, and latent fault test effectiveness ...
A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical '1', '0' and 'X'. For example, an input is tied to a logical 1 state during test generation to ...