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  2. Low power flip-flop - Wikipedia

    en.wikipedia.org/wiki/Low_power_flip-flop

    Sequential elements, latches, and flip-flops dissipate power when there is switching in their internal capacitance. This may happen with every clock transition/pulse into the sequential element. Sometimes the sequential elements need to change their state, but sometimes they retain their state and their output remains the same, before and after ...

  3. Modified condition/decision coverage - Wikipedia

    en.wikipedia.org/wiki/Modified_condition/...

    The number of tests required based on the source code could be considerably different depending upon the coverage required, although semantically we would want to test both approaches with a minimum number of tests. [citation needed] Another example that could be considered as "cheating" to achieve higher MC/DC is:

  4. Flip-flop (electronics) - Wikipedia

    en.wikipedia.org/wiki/Flip-flop_(electronics)

    The difference is that NAND logical gates are used in the gated D latch, while SR NAND latches are used in the positive-edge-triggered D flip-flop. The role of these latches is to "lock" the active output producing low voltage (a logical zero); thus the positive-edge-triggered D flip-flop can also be thought of as a gated D latch with latched ...

  5. Game testing - Wikipedia

    en.wikipedia.org/wiki/Game_testing

    Game testing, also called quality assurance (QA) testing within the video game industry, is a software testing process for quality control of video games. [ 1 ] [ 2 ] [ 3 ] The primary function of game testing is the discovery and documentation of software defects .

  6. Level-sensitive scan design - Wikipedia

    en.wikipedia.org/wiki/Level-sensitive_scan_design

    Within the field of electronics Level-sensitive scan design (LSSD) is part of an integrated circuit manufacturing test process. It is a DFT scan design method which uses separate system and scan clocks to distinguish between normal and test mode. Latches are used in pairs, each has a normal data input, data output and clock for system operation.

  7. Form, fit and function - Wikipedia

    en.wikipedia.org/wiki/Form,_fit_and_function

    Form, Fit, and Function (also F3 or FFF) is a concept used in various industries, including manufacturing, engineering, and architecture, to describe aspects of a product's design, performance, and compliance to a specification.

  8. Excitation table - Wikipedia

    en.wikipedia.org/wiki/Excitation_table

    In order to complete the excitation table of a flip-flop, one needs to draw the Q(t) and Q(t + 1) for all possible cases (e.g., 00, 01, 10, and 11), and then make the value of flip-flop such that on giving this value, one shall receive the input as Q(t + 1) as desired.

  9. Sandbox (software development) - Wikipedia

    en.wikipedia.org/wiki/Sandbox_(software_development)

    A sandbox is a testing environment that isolates untested code changes and outright experimentation from the production environment or repository [1] in the context of software development, including web development, automation, revision control, configuration management (see also change management), and patch management.