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  2. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    DFT affects and depends on the methods used for test development, test application, and diagnostics. Most tool-supported DFT practiced in the industry today, at least for digital circuits, is predicated on a Structural test paradigm. Structural test makes no direct attempt to determine if the overall functionality of the circuit is correct.

  3. Test compression - Wikipedia

    en.wikipedia.org/wiki/Test_compression

    Test compression is a technique used to reduce the time and cost of testing integrated circuits.The first ICs were tested with test vectors created by hand. It proved very difficult to get good coverage of potential faults, so Design for testability (DFT) based on scan and automatic test pattern generation (ATPG) were developed to explicitly test each gate and path in a design.

  4. Level-sensitive scan design - Wikipedia

    en.wikipedia.org/wiki/Level-sensitive_scan_design

    Within the field of electronics Level-sensitive scan design (LSSD) is part of an integrated circuit manufacturing test process. It is a DFT scan design method which uses separate system and scan clocks to distinguish between normal and test mode. Latches are used in pairs, each has a normal data input, data output and clock for system operation.

  5. Quantum ESPRESSO - Wikipedia

    en.wikipedia.org/wiki/Quantum_ESPRESSO

    Quantum ESPRESSO (Quantum Open-Source Package for Research in Electronic Structure, Simulation, and Optimization; QE) [2] [3] is a suite for first-principles electronic-structure calculations and materials modeling, distributed for free and as free software under the GNU General Public License.

  6. Fault coverage - Wikipedia

    en.wikipedia.org/wiki/Fault_coverage

    A fault coverage test passes when at least a specified percentage of all possible faults can be detected. If it does not pass, at least three options are possible. First, the designer can augment or otherwise improve the vector set, perhaps by using a more effective automatic test pattern generation tool. Second, the circuit may be re-defined ...

  7. Test engineer - Wikipedia

    en.wikipedia.org/wiki/Test_engineer

    Verifying that the currently available test equipment is adequate for testing the proposed design. If new equipment is needed, budgetary concerns have been addressed and sufficient lead time exists for new equipment installation and verification. Also, new test equipment may require training for test equipment operators and supervisors.