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Multi-wavelength anomalous diffraction (sometimes Multi-wavelength anomalous dispersion; abbreviated MAD) is a technique used in X-ray crystallography that facilitates the determination of the three-dimensional structure of biological macromolecules (e.g. DNA, drug receptors) via solution of the phase problem.
Because diffraction is the result of addition of all waves (of given wavelength) along all unobstructed paths, the usual procedure is to consider the contribution of an infinitesimally small neighborhood around a certain path (this contribution is usually called a wavelet) and then integrate over all paths (= add all wavelets) from the source to the detector (or given point on a screen).
Diffraction is the same physical effect as interference, but interference is typically applied to superposition of a few waves and the term diffraction is used when many waves are superposed. [1]: 433 Italian scientist Francesco Maria Grimaldi coined the word diffraction and was the first to record accurate observations of the phenomenon in 1660.
Bragg diffraction [9]: 16 Two beams with identical wavelength and phase approach a crystalline solid and are scattered off two different atoms within it. The lower beam traverses an extra length of 2dsinθ. Constructive interference occurs when this length is equal to an integer multiple of the wavelength of the radiation.
A powerful solution is the multi-wavelength anomalous dispersion (MAD) method. In this technique, atoms' inner electrons [clarification needed] absorb X-rays of particular wavelengths, and reemit the X-rays after a delay, inducing a phase shift in all of the reflections, known as the anomalous dispersion effect. Analysis of this phase shift ...
Same double-slit assembly (0.7 mm between slits); in top image, one slit is closed. In the single-slit image, a diffraction pattern (the faint spots on either side of the main band) forms due to the nonzero width of the slit. This diffraction pattern is also seen in the double-slit image, but with many smaller interference fringes.
Anomalous X-ray scattering (AXRS or XRAS) is a non-destructive determination technique within X-ray diffraction that makes use of the anomalous dispersion that occurs when a wavelength is selected that is in the vicinity of an absorption edge of one of the constituent elements of the sample. It is used in materials research to study nanometer ...
Memorial in Jena, Germany to Ernst Karl Abbe, who approximated the diffraction limit of a microscope as = , where d is the resolvable feature size, λ is the wavelength of light, n is the index of refraction of the medium being imaged in, and θ (depicted as α in the inscription) is the half-angle subtended by the optical objective lens (representing the numerical aperture).