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  2. Diffractometer - Wikipedia

    en.wikipedia.org/wiki/Diffractometer

    There are several types of X-ray diffractometer, depending on the research field (material sciences, powder diffraction, life sciences, structural biology, etc.) and the experimental environment, if it is a laboratory with its home X-ray source or a Synchrotron. In laboratory, diffractometers are usually an "all in one" equipment, including the ...

  3. Miniflex - Wikipedia

    en.wikipedia.org/wiki/Miniflex

    Miniflex is an X-ray diffraction (XRD) analytical measuring instrument produced by Rigaku.The current instrument is the fourth in a series introduced in 1973. Original Miniflex - ca. 1973 2nd Generation Miniflex - ca. 1976 3rd Generation Miniflex - ca. 1995

  4. Rigaku - Wikipedia

    en.wikipedia.org/wiki/Rigaku

    1954 Rigaku introduced the first automatic-recording X-ray diffractometer. 1976 Rigaku developed the first parallel-beam type X-ray diffractometer for stress analysis, as well as the first X-ray fluorescence spectrometers capable of carbon analysis ( 1976 ) and boron analysis ( 1981 ).

  5. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    A powder X-ray diffractometer in motion. X-ray crystallography is the experimental science of determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract in specific directions.

  6. PILATUS (detector) - Wikipedia

    en.wikipedia.org/wiki/PILATUS_(detector)

    Diffraction pattern of the protein thaumatin in its tetragonal crystal form, recorded on a PILATUS 6M at the HZB MX beamline BL14.1.. PILATUS is the name of a series of x-ray detectors originally developed by the Paul Scherrer Institute at the Swiss Light Source and further developed and commercialized by DECTRIS.

  7. X-ray diffraction computed tomography - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction_computed...

    X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [1] using a laboratory diffractometer and a monochromatic X-ray pencil beam.

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