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  2. Bruker Announces New ECO™ Line of X-ray Diffraction (XRD) and ...

    www.aol.com/news/2013-07-16-bruker-announces-new...

    Bruker Announces New ECO™ Line of X-ray Diffraction (XRD) and X-ray Fluorescence (XRF) Instruments MADISON, Wis. & KARLSRUHE, Germany--(BUSINESS WIRE)-- Bruker today announced the launch of the ...

  3. Bruker - Wikipedia

    en.wikipedia.org/wiki/Bruker

    Bruker Corporation is an American manufacturer of scientific instruments for molecular and materials research, as well as for industrial and applied analysis. It is headquartered in Billerica, Massachusetts, and is the publicly traded parent company of Bruker Scientific Instruments (Bruker AXS, Bruker BioSpin, Bruker Daltonics and Bruker Optics) and Bruker Energy & Supercon Technologies (BEST ...

  4. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    First X-ray diffraction view of Martian soil – CheMin analysis reveals feldspar, pyroxenes, olivine and more (Curiosity rover at "Rocknest", October 17, 2012). [77] The application of X-ray crystallography to mineralogy began with the structure of garnet, which was determined in 1924 by Menzer.

  5. Diffractometer - Wikipedia

    en.wikipedia.org/wiki/Diffractometer

    There are several types of X-ray diffractometer, depending on the research field (material sciences, powder diffraction, life sciences, structural biology, etc.) and the experimental environment, if it is a laboratory with its home X-ray source or a Synchrotron. In laboratory, diffractometers are usually an "all in one" equipment, including the ...

  6. Bruker Announces the N8 HORIZONTM, an Innovative ... - AOL

    www.aol.com/news/2012-11-18-bruker-announces-the...

    Bruker Announces the N8 HORIZON TM , an Innovative, Compact Small Angle X-ray Scattering System for Advanced Materials Research SYDNEY--(BUSINESS WIRE)-- At the International Small-Angle ...

  7. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern. It is different from X-ray crystallography which exploits X-ray diffraction to determine the arrangement of atoms in materials, and also has other components such as ways to map from experimental diffraction measurements to the positions of atoms.

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