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  2. Diffractometer - Wikipedia

    en.wikipedia.org/wiki/Diffractometer

    There are several types of X-ray diffractometer, depending on the research field (material sciences, powder diffraction, life sciences, structural biology, etc.) and the experimental environment, if it is a laboratory with its home X-ray source or a Synchrotron. In laboratory, diffractometers are usually an "all in one" equipment, including the ...

  3. Miniflex - Wikipedia

    en.wikipedia.org/wiki/Miniflex

    Miniflex is an X-ray diffraction (XRD) analytical measuring instrument produced by Rigaku.The current instrument is the fourth in a series introduced in 1973. Original Miniflex - ca. 1973 2nd Generation Miniflex - ca. 1976 3rd Generation Miniflex - ca. 1995

  4. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    A powder X-ray diffractometer in motion. X-ray crystallography is the experimental science of determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract in specific directions.

  5. X-ray fluorescence - Wikipedia

    en.wikipedia.org/wiki/X-ray_fluorescence

    X-ray fluorescence (XRF) is the ... The manufacture of curved crystals to acceptable tolerances increases their price considerably. ... X-ray diffraction (XRD) is ...

  6. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering, when there is no change in the energy of the waves. The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern.

  7. X-ray diffraction computed tomography - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction_computed...

    X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [1] using a laboratory diffractometer and a monochromatic X-ray pencil beam.

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