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  2. Control chart - Wikipedia

    en.wikipedia.org/wiki/Control_chart

    Control charts are graphical plots used in production control to determine whether quality and manufacturing processes are being controlled under stable conditions. (ISO 7870-1) [1] The hourly status is arranged on the graph, and the occurrence of abnormalities is judged based on the presence of data that differs from the conventional trend or deviates from the control limit line.

  3. Statistical process control - Wikipedia

    en.wikipedia.org/wiki/Statistical_process_control

    Simple example of a process control chart, tracking the etch (removal) rate of Silicon in an ICP Plasma Etcher at a microelectronics waferfab. [1] Time-series data shows the mean value and ±5% bars. A more sophisticated SPC chart may include "control limit" & "spec limit" % lines to indicate whether/what action should be taken.

  4. Bell Labs - Wikipedia

    en.wikipedia.org/wiki/Bell_Labs

    Bell Labs [b] is an American industrial research and development (R&D) company, currently operating as a subsidiary of Finnish technology company Nokia.With a long history, Bell Labs is credited with the development of radio astronomy, the transistor, the laser, the photovoltaic cell, the charge-coupled device (CCD), information theory, the Unix operating system, and the programming languages ...

  5. Laboratory quality control - Wikipedia

    en.wikipedia.org/wiki/Laboratory_quality_control

    A control chart is a more specific kind of run chart. The control chart is one of the seven basic tools of quality control, which also include the histogram, pareto chart, check sheet, cause and effect diagram, flowchart and scatter diagram. Control charts prevent unnecessary process adjustments, provide information about process capability ...

  6. BESYS - Wikipedia

    en.wikipedia.org/wiki/BESYS

    The first system actually used at Bell Labs was BESYS-2. The system was resident on magnetic tape , and occupied the lowest 64 (36-bit) words and the highest 4K words of memory. The upper 4K words held the resident portion of the monitor, and could be partially swapped to magnetic drum to free up additional core for the user program if needed.

  7. Walter A. Shewhart - Wikipedia

    en.wikipedia.org/wiki/Walter_A._Shewhart

    Walter Andrew Shewhart (pronounced like "shoe-heart"; March 18, 1891 – March 11, 1967) was an American physicist, engineer and statistician. He is sometimes also known as the grandfather of statistical quality control and also related to the Shewhart cycle.

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  9. Marcus Weldon - Wikipedia

    en.wikipedia.org/wiki/Marcus_Weldon

    In 1995, he accepted a post doctoral position at Bell Labs in Murray Hill, working in the group of Yves Chabal, in the Physical Sciences research laboratory, headed by Horst Stormer. He studied the surface oxidation of silicon [ 3 ] and the science of wafer bonding [ 4 ] and splitting by hydrogen implantation, winning multiple awards for his work.