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ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
A digital pattern generator is a piece of electronic test equipment or software used to generate digital electronic stimuli. Digital electronics stimuli are a specific kind of electrical waveform varying between two conventional voltages that correspond to two logic states ("low state" and "high state", "0" and "1").
FAN algorithm is an algorithm for automatic test pattern generation (ATPG). It was invented in 1983 by Hideo Fujiwara and Takeshi Shimono at the Department of Electronic Engineering, Osaka University, Japan. [1] It was the fastest ATPG algorithm at that time and was subsequently adopted by industry.
The disparity of a bit pattern is the difference in the number of one bits vs the number of zero bits. The running disparity is the running total of the disparity of all previously transmitted bits. [5] The simplest possible line code, unipolar, gives too many errors on such systems, because it has an unbounded DC component.
The content and layout of the pattern, as well as the generator, was designed and made by Danish engineer Finn Hendil (1939–2011) at the Philips TV & Test Equipment laboratory in Amager, south of Copenhagen in 1965–66. [4] It has been used in Australia, Spain, United Arab Emirates, [5] Denmark, [6] Israel, [7] Qatar, and the Netherlands.
An electronic circuit element used for generating waveforms within other apparatus that can be used in communications and instrumentation circuits, and also in a function generator instrument. Examples are the Exar XR2206 [ 7 ] and the Intersil ICL8038 integrated circuits [ citation needed ] , which can generate sine, square, triangle, ramp ...
The binary signal is encoded using rectangular pulse-amplitude modulation with polar NRZ(L), or polar non-return-to-zero-level code. In telecommunications, a non-return-to-zero (NRZ) line code is a binary code in which ones are represented by one significant condition, usually a positive voltage, while zeros are represented by some other significant condition, usually a negative voltage, with ...
Polar plots of the horizontal cross sections of a (virtual) Yagi–Uda antenna. The outline connects points with equal field power. The radiation pattern of an antenna is a plot of the relative field strength of the radio waves emitted by the antenna at different angles in the far field. It is typically represented by a three-dimensional graph ...