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  2. List of free electronics circuit simulators - Wikipedia

    en.wikipedia.org/wiki/List_of_free_electronics...

    List of free analog and digital electronic circuit simulators, available for Windows, macOS, Linux, and comparing against UC Berkeley SPICE. The following table is split into two groups based on whether it has a graphical visual interface or not.

  3. Open-circuit time constant method - Wikipedia

    en.wikipedia.org/wiki/Open-circuit_time_constant...

    Then the resistance seen by the test voltage is found using the circuit in the right panel of Figure 1 and is simply V X / I X = R 1. Form the product C 1 R 1. Add these terms. In effect, it is as though each capacitor charges and discharges through the resistance found in the circuit when the other capacitor is an open circuit.

  4. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    While in-circuit test is a very powerful tool for testing PCBs, it has these limitations: Parallel components can often only be tested as one component if the components are of the same type (i.e. two resistors); though different components in parallel may be testable using a sequence of different tests - e.g. a DC voltage measurement versus a measurement of AC injection current at a node.

  5. LCR meter - Wikipedia

    en.wikipedia.org/wiki/LCR_meter

    An LCR meter is a type of electronic test equipment used to measure the inductance (L), capacitance (C), and resistance (R) of an electronic component. [1] In the simpler versions of this instrument the impedance was measured internally and converted for display to the corresponding capacitance or inductance value. Readings should be reasonably ...

  6. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.

  7. Curve tracer - Wikipedia

    en.wikipedia.org/wiki/Curve_tracer

    A curve tracer is a specialised piece of electronic test equipment used to analyze the characteristics of discrete electronic components, such as diodes, transistors, thyristors, and vacuum tubes. The device contains voltage and current sources that can be used to stimulate the device under test (DUT).

  8. Symbolic circuit analysis - Wikipedia

    en.wikipedia.org/wiki/Symbolic_Circuit_Analysis

    Symbolic circuit analysis is a formal technique of circuit analysis to calculate the behaviour or characteristic of an electric/electronic circuit with the independent variables (time or frequency), the dependent variables (voltages and currents), and (some or all of) the circuit elements represented by symbols. [1] [2]

  9. Electronic circuit simulation - Wikipedia

    en.wikipedia.org/wiki/Electronic_circuit_simulation

    Simulation software allows for the modeling of circuit operation and is an invaluable analysis tool. Due to its highly accurate modeling capability, many colleges and universities use this type of software for the teaching of electronics technician and electronics engineering programs.