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  2. Rogowski coil - Wikipedia

    en.wikipedia.org/wiki/Rogowski_coil

    The picture shows a Rogowski coil encircling a current-carrying cable. The output of the coil, v(t), is connected to a lossy integrator circuit to obtain a voltage V out (t) that is proportional to I(t). A Rogowski coil, named after Walter Rogowski, is an electrical device for measuring alternating current (AC) or high

  3. Test probe - Wikipedia

    en.wikipedia.org/wiki/Test_probe

    It is a magnetically balanced coil that measures current by electronically evaluating the line integral around a current. High-frequency, small-signal, passive current probes typically have a frequency range of several kilohertz to over 100 MHz. The Tektronix P6022 has a range from 935 Hz to 200 MHz. (Tektronix 1983, p. 435)

  4. Eddy-current testing - Wikipedia

    en.wikipedia.org/wiki/Eddy-current_testing

    Variations in the electrical conductivity and magnetic permeability of the test object, and the presence of defects causes a change in eddy current and a corresponding change in phase and amplitude that can be detected by measuring the impedance changes in the coil, which is a telltale sign of the presence of defects. [5]

  5. Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Electronic_test_equipment

    The addition of a high-speed switching system to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well ...

  6. Flying probe - Wikipedia

    en.wikipedia.org/wiki/Flying_probe

    One limitation in flying probe test methods is the speed at which measurements can be taken; the probes must be moved to each new test site on the board, and then a measurement must be completed. Bed-of-nails testers touch each test point simultaneously and electronic switching of instruments between test pins is more rapid than movement of probes.

  7. Bead probe technology - Wikipedia

    en.wikipedia.org/wiki/Bead_probe_technology

    Bead probe technology is a probing method used to connect electronic test equipment to the device under test (DUT) within a bed of nails fixture. The technique was first used in the 1990s [ 3 ] and originally given the name “Waygood Bump” after one of the main proponents, Rex Waygood.

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