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In crystallography, the R-factor (sometimes called residual factor or reliability factor or the R-value or R Work) is a measure of the disagreement between the crystallographic model and the experimental X-ray diffraction data - lower the R value lower is the disagreement or
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.
CNS is an extension of X-PLOR released in 1987, [226] and is used for solving structures based on X-ray diffraction or solution NMR data. [ 227 ] 1994 - Jan Pieter Abrahams et al. reported the structure of an F1- ATPase which uses the proton-motive force across the inner mitochondrial membrane to facilitate the synthesis of adenosine ...
In crystallography, a Greninger chart [1] / ˈ ɡ r ɛ n ɪ ŋ ər / is a chart that allows angular relations between zones and planes in a crystal to be directly read from an x-ray diffraction photograph. The Greninger chart is a simple trigonometric tool to determine g and d for a fixed sample-to-film distance.
X-ray powder diffraction fingerprinting has become the standard tool for the identification of single or multiple crystal phases and is widely used in such fields as metallurgy, mineralogy, forensic science, archeology, condensed matter physics, and the biological and pharmaceutical sciences.
Wiley, 2001 (chapter 5: diffraction by perfect crystals). André Authier: Dynamical theory of X-ray diffraction. IUCr monographs on crystallography, no. 11. Oxford University Press (1st edition 2001/ 2nd edition 2003). ISBN 0-19-852892-2. R. W. James: The Optical Principles of the Diffraction of X-rays. Bell., 1948.
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