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  2. Vergence (optics) - Wikipedia

    en.wikipedia.org/wiki/Vergence_(optics)

    Light does not actually consist of imaginary rays and light sources are not single-point sources, thus vergence is typically limited to simple ray modeling of optical systems. In a real system, the vergence is a product of the diameter of a light source, its distance from the optics, and the curvature of the optical surfaces.

  3. Convergent beam electron diffraction - Wikipedia

    en.wikipedia.org/wiki/Convergent_beam_electron...

    Beam Rocking (BR)-CBED: With this technique, by rocking the incident beam with a rocking coil placed above the specimen, a virtual convergent beam is produced. Given that the diameter of the beam on the specimen is a few micrometers, this method has made CBED possible for materials that are susceptible to strong convergent beams.

  4. Conoscopy - Wikipedia

    en.wikipedia.org/wiki/Conoscopy

    A beam of convergent (or divergent) light is known to be a linear superposition of many plane waves over a cone of solid angles. The raytracing of Figure 1 illustrates the basic concept of conoscopy : transformation of a directional distribution of rays of light in the front focal plane into a lateral distribution ( directions image ) appearing ...

  5. Beam divergence - Wikipedia

    en.wikipedia.org/wiki/Beam_divergence

    Beam divergence usually refers to a beam of circular cross section, but not necessarily so. A beam may, for example, have an elliptical cross section, in which case the orientation of the beam divergence must be specified, for example with respect to the major or minor axis of the elliptical cross section.

  6. Selected area diffraction - Wikipedia

    en.wikipedia.org/wiki/Selected_area_diffraction

    An SADP is acquired under parallel electron illumination. In the case of convergent beam, a convergent beam electron diffraction (CBED) is achieved. [6] [3] The beam used in SAD is broad illuminating a wide sample area. In order to analyze only a specific sample area, the selected area aperture in the image plane is used.

  7. Electron crystallography - Wikipedia

    en.wikipedia.org/wiki/Electron_crystallography

    One key step was the development in 1936 by Walther Kossel and Gottfried Möllenstedt of convergent beam electron diffraction (CBED), [23] This approach was extended by Peter Goodman and Gunter Lehmpfuhl, [24] then mainly by the groups of John Steeds [25] [26] [27] and Michiyoshi Tanaka [28] [29] who showed how to use CBED patterns to determine ...

  8. Focal length - Wikipedia

    en.wikipedia.org/wiki/Focal_length

    For a converging lens (for example a convex lens), the focal length is positive and is the distance at which a beam of collimated light will be focused to a single spot. For a diverging lens (for example a concave lens ), the focal length is negative and is the distance to the point from which a collimated beam appears to be diverging after ...

  9. Kikuchi lines (physics) - Wikipedia

    en.wikipedia.org/wiki/Kikuchi_lines_(physics)

    Kikuchi lines in a convergent beam diffraction pattern of single crystal silicon taken with a 300 keV electron beam. The figure on the left shows the Kikuchi lines leading to a silicon [100] zone, taken with the beam direction approximately 7.9° away from the zone along the (004) Kikuchi band.