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The format was originally developed in 1973 to store single-line seismic reflection digital data on magnetic tapes.The specification was published in 1975. [1]The format and its name evolved from the SEG "Ex" or Exchange Tape Format.
Reflection seismology, more commonly referred to as "seismic reflection" or abbreviated to "seismic" within the hydrocarbon industry, is used by petroleum geologists and geophysicists to map and interpret potential petroleum reservoirs. The size and scale of seismic surveys has increased alongside the significant increases in computer power ...
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Depth conversion is an important step of the seismic reflection method, which converts the acoustic wave travel time to actual depth, based on the acoustic velocity of subsurface medium (sediments, rocks, water). Depth conversion integrates several sources of information about the subsurface velocity to derive a three-dimensional velocity model:
In reflection seismology, a seismic attribute is a quantity extracted or derived from seismic data that can be analysed in order to enhance information that might be more subtle in a traditional seismic image, leading to a better geological or geophysical interpretation of the data. [1]
Seismic reflection is a sound wave bounced back from subsurface at the interface between media with different acoustic properties (density and wave velocity). [3] In geology, the reflections normally occur at the contacts between different rocks, for example, between layers of sedimentary rocks (stratification).
Modern seismic reflection surveys are designed and acquired in such a way that the same point on the subsurface is sampled multiple times, with each sample having a different source and receiver location. The seismic data is then carefully processed to preserve seismic amplitudes and accurately determine the spatial coordinates of each sample.
As opposed to analysis of P-wave to P-wave (P-P) reflection, c-wave (P-S) analysis is more complex. C-wave analysis requires at least three times as many measurement channels per station. Variations in reflection depths can cause significant analytic problems. Gathering, mapping, and binning c-wave data is also more difficult than P-P data ...