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Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
AFM operation is usually described as one of three modes, according to the nature of the tip motion: contact mode, also called static mode (as opposed to the other two modes, which are called dynamic modes); tapping mode, also called intermittent contact, AC mode, or vibrating mode, or, after the detection mechanism, amplitude modulation AFM ...
This interaction depends on the type of SPM, for scanning tunneling microscopy the interaction is the tunnel current, for contact mode AFM or MFM it is the cantilever deflection, etc. The type of feedback loop used is usually a PI-loop, which is a PID-loop where the differential gain has been set to zero (as it amplifies noise).
The feedback loop is particularly important in non-contact AFM techniques, particularly in pc-AFM. As previously mentioned, in non-contact mode the cantilever is stationary and the tip does not come into physical contact with the sample surface. [36] The cantilever behaves as a spring and oscillates at its resonance frequency.
SKP has been used to investigate the surface potential of materials used in solar cells, with the advantage that it is a non-contact, and therefore a non-destructive technique. [28] It can be used to determine the electron affinity of different materials in turn allowing the energy level overlap of conduction bands of differing materials to be ...
In this mode the cantilever is oscillated at a resonant frequency of the cantilever and the AFM tip is held such that it only senses with long range electrostatic forces without entering the repulsive contact regime. In this non-contact regime, the electric force gradient causes a shift in the resonance frequency of the cantilever.
In shear force mode and other contact operation it is not conducive for studying soft materials. It has long scan times for large sample areas for high resolution imaging. [citation needed] An additional limitation is the predominant orientation of the polarization state of the interrogating light in the near-field of the scanning tip. Metallic ...
With AFM, structural morphology is probed using simple tapping or contact modes that utilize van der Waals interactions between tip and sample to maintain a constant probe deflection amplitude (constant force mode) or maintain height while measuring tip deflection (constant height mode).