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  2. Very-large-scale integration - Wikipedia

    en.wikipedia.org/wiki/Very-large-scale_integration

    Very-large-scale integration (VLSI) is the process of creating an integrated circuit (IC) by combining millions or billions of MOS transistors onto a single chip. VLSI began in the 1970s when MOS integrated circuit (metal oxide semiconductor) chips were developed and then widely adopted, enabling complex semiconductor and telecommunications technologies.

  3. Slew rate - Wikipedia

    en.wikipedia.org/wiki/Slew_rate

    slew rate effect on a square wave: red=desired output, green=actual output. In electronics and electromagnetics, slew rate is defined as the change of voltage or current, or any other electrical or electromagnetic quantity, per unit of

  4. VLSI Project - Wikipedia

    en.wikipedia.org/wiki/VLSI_Project

    The VLSI Project was a DARPA-program initiated by Robert Kahn in 1978 [1] that provided research funding to a wide variety of university-based teams in an effort to improve the state of the art in microprocessor design, then known as Very Large Scale Integration (VLSI).

  5. List of semiconductor scale examples - Wikipedia

    en.wikipedia.org/wiki/List_of_semiconductor...

    IBM T.J. Watson Research Center [52] [53] 180 nm? GAAFET: Fujio Masuoka, Hiroshi Takato, Kazumasa Sunouchi, N. Okabe Toshiba [54] [55] [56] December 1989: 200 nm: FinFET: Digh Hisamoto, Toru Kaga, Yoshifumi Kawamoto, Eiji Takeda Hitachi Central Research Laboratory [57] [58] [59] December 1998: 17 nm: FinFET Digh Hisamoto, Chenming Hu, Tsu-Jae ...

  6. Mead–Conway VLSI chip design revolution - Wikipedia

    en.wikipedia.org/wiki/Mead–Conway_VLSI_chip...

    The Mead–Conway VLSI chip design revolution, or Mead and Conway revolution, was a very-large-scale integration design revolution starting in 1978 which resulted in a worldwide restructuring of academic materials in computer science and electrical engineering education, and was paramount for the development of industries based on the application of microelectronics.

  7. Process corners - Wikipedia

    en.wikipedia.org/wiki/Process_corners

    The last two corners (FS, SF) are called "skewed" corners, and are cause for concern. This is because one type of FET will switch much faster than the other, and this form of imbalanced switching can cause one edge of the output to have much less slew than the other edge. Latching devices may then record incorrect values in the logic chain.

  8. Shmoo plot - Wikipedia

    en.wikipedia.org/wiki/Shmoo_plot

    Cover of the comic book "THE SHMOO" The plot takes its name from the Shmoo, a fictional species created by Al Capp in the cartoon Li'l Abner.These small, blob-like creatures have shapes similar to the "working" volumes that would be enclosed by shmoo plots drawn against three independent variables (such as voltage, temperature, and response speed).

  9. Physical verification - Wikipedia

    en.wikipedia.org/wiki/Physical_verification

    ERC verifies the correctness of power and ground connections, and that signal transition times (slew), capacitive loads and fanouts are appropriately bounded. [1] This might include checking for Well and substrate areas for proper contacts and spacings thereby ensuring correct power and ground connections; Unconnected inputs or shorted outputs.