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  2. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.

  3. Atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_microscopy

    Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

  4. Colloidal probe technique - Wikipedia

    en.wikipedia.org/wiki/Colloidal_probe_technique

    The colloidal probe technique is commonly used to measure interaction forces acting between colloidal particles and/or planar surfaces in air or in solution. This technique relies on the use of an atomic force microscope (AFM). However, instead of a cantilever with a sharp AFM tip, one uses the colloidal probe. The colloidal probe consists of a ...

  5. Scanning probe microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_probe_microscopy

    Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.

  6. Fluidic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Fluidic_force_microscopy

    Fluidic force microscopy (FluidFM) is a type of scanning probe microscopy, and is typically used on a standard inverted light microscope. The unique characteristic of FluidFM is that it introduces microscopic channels into AFM probes. Those channels can have an aperture of less than 300 nm, or 500 times thinner than a human hair.

  7. Non-contact atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Non-contact_atomic_force...

    Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...

  8. Probe tip - Wikipedia

    en.wikipedia.org/wiki/Probe_Tip

    CNT tips are also used in tapping-mode Scanning Force Microscopy (SFM), which is a technique where a tip taps a surface by a cantilever driven near resonant frequency of the cantilever. The CNT probe tips fabricated using CVD technique can be used for imaging of biological macromolecules, [86] semiconductor [35] and chemical structure. [32]

  9. Piezoresponse force microscopy - Wikipedia

    en.wikipedia.org/wiki/Piezoresponse_force_microscopy

    Piezoresponse force microscopy is a technique which since its inception and first implementation by Güthner and Dransfeld [1] has steadily attracted more and more interest. This is due in large part to the many benefits and few drawbacks that PFM offers researchers in varying fields from ferroelectrics, semiconductors and even biology. [ 2 ]