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Another measure of reflectance, depending only on the outgoing direction, is I/F, where I is the radiance reflected in a given direction and F is the incoming radiance averaged over all directions, in other words, the total flux of radiation hitting the surface per unit area, divided by π. [2]
Thus, the measurement results for a polymer are based on the Forouhi–Bloomer formulation for crystalline materials. Most of the structure in the n(λ) and k(λ) spectra occurs in the deep UV wavelength range and thus to properly characterize a film of this nature, it is necessary that the measured reflectance data in the deep UV range is ...
To measure the spatial variation of the refractive index in a sample phase-contrast imaging methods are used. These methods measure the variations in phase of the light wave exiting the sample. The phase is proportional to the optical path length the light ray has traversed, and thus gives a measure of the integral of the refractive index along ...
In telecommunications and transmission line theory, the reflection coefficient is the ratio of the complex amplitude of the reflected wave to that of the incident wave. The voltage and current at any point along a transmission line can always be resolved into forward and reflected traveling waves given a specified reference impedance Z 0.
The measurement scale, gloss units (GU), of a glossmeter is a scaling based on a highly polished reference black glass standard with a defined refractive index having a specular reflectance of 100GU at the specified angle.
Spectrophotometry is a branch of electromagnetic spectroscopy concerned with the quantitative measurement of the reflection or transmission properties of a material as a function of wavelength. [2] Spectrophotometry uses photometers , known as spectrophotometers, that can measure the intensity of a light beam at different wavelengths.
By using polarized light, normal ambient unpolarized stray light does not significantly influence the measurement, no dark box is necessary. No reference measurement is necessary. Ellipsometry is especially superior to reflectivity measurements when studying anisotropic samples.
In architecture, light reflectance value (LRV), is a measure of visible and usable light that is reflected from a surface when illuminated by a light source. [1] The measurement is most commonly used by design professionals, such as architectural color consultants , architects , environmental graphic designers and interior designers .