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Thin-film thickness monitors, deposition rate controllers, and so on, are a family of instruments used in high and ultra-high vacuum systems. They can measure the thickness of a thin film, not only after it has been made, but while it is still being deposited, and some can control either the final thickness of the film, the rate at which it is deposited, or both.
The act of applying a thin film to a surface is thin-film deposition – any technique for depositing a thin film of material onto a substrate or onto previously deposited layers. "Thin" is a relative term, but most deposition techniques control layer thickness within a few tens of nanometres .
In situ ellipsometry refers to dynamic measurements during the modification process of a sample. This process can be used to study, for instance, the growth of a thin film, [8] including calcium phosphate mineralization at the air-liquid interface, [9] etching or cleaning of a sample. By in situ ellipsometry measurements it is possible to ...
Transient photocurrent (TPC) is a measurement technique, typically employed in the physics of thin film semiconductors.TPC allows to study the time-dependent (on a microsecond time scale) extraction of charges generated by photovoltaic effect in semiconductor devices, such as solar cells.
The diffusive gradients in thin films (DGT) technique is an environmental chemistry technique for the detection of elements and compounds in aqueous environments, including natural waters, [1] sediments [2] and soils. [3] It is well suited to in situ detection of bioavailable toxic trace metal contaminants.
Inductive measurement is used as well. This method measures the shielding effect created by eddy currents. In one version of this technique a conductive sheet under test is placed between two coils. This non-contact sheet resistance measurement method also allows to characterize encapsulated thin-films or films with rough surfaces. [2]